In situ He + irradiation of the double solid solution (Ti 0.5 ,Zr 0.5) 2 (Al 0.5 ,Sn 0.5) C MAX phase: Defect evolution in the 350–800 °C temperature range

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In situ He + irradiation of the double solid solution (Ti 0.5 ,Zr 0.5) 2 (Al 0.5 ,Sn 0.5) C MAX phase : Defect evolution in the 350–800 °C temperature range. / Tunca, Bensu; Greaves, G.; Hinks, Jonathan A.; Persson, Per O. A.; Vleugels, Jozef; Lambrinou, Konstantza.

In: Acta Materialia, Vol. 206, 116606, 29.12.2020, p. 1-13.

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@article{993f27474d3d4e1f887c8c830cd08170,
title = "In situ He + irradiation of the double solid solution (Ti 0.5 ,Zr 0.5) 2 (Al 0.5 ,Sn 0.5) C MAX phase: Defect evolution in the 350–800 °C temperature range",
abstract = "Thin foils of the double solid solution (Zr 0.5 ,Ti 0.5 ) 2 (Al 0.5 ,Sn 0.5 )C MAX phase were in situ irradiated in a transmission electron microscope (TEM) up to a fluence of 1.3 ×10 17 ions cm -2 ( ∼7.5 dpa), using 6 keV He + ions. Irradiations were performed in the 350–800 °C temperature range. In situ and post-irradiation examination (PIE) by TEM was used to study the evolution of irradiation-induced defects as function of dose and temperature. Spherical He bubbles and string-like arrangements thereof, He platelets, and dis- location loops were observed. Dislocation loop segments were found to lie in non-basal-planes. At irradi- ation temperatures ≥450 °C, grain boundary tearing was observed locally due to He bubble segregation. However, the tears did not result in transgranular crack propagation. The intensity of specific spots in the selected area electron diffraction patterns weakened upon irradiation at 450 and 500 °C, indicating an increased crystal symmetry. Above 700 °C this was not observed, indicating damage recovery at the high end of the investigated temperature range. High-resolution scanning TEM imaging performed during the PIE of foils previously irradiated at 700 °C showed that the chemical ordering and nanolamination of the MAX phase were preserved after 7.5 dpa He + irradiation. The size distributions of the He platelets and spherical bubbles were evaluated as function of temperature and dose.",
keywords = "MAX phase, Solid solutions, TEM, Irradiation",
author = "Bensu Tunca and G. Greaves and Hinks, {Jonathan A.} and Persson, {Per O. A.} and Jozef Vleugels and Konstantza Lambrinou",
note = "Score=10",
year = "2020",
month = dec,
day = "29",
doi = "10.1016/j.actamat.2020.116606",
language = "English",
volume = "206",
pages = "1--13",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

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TY - JOUR

T1 - In situ He + irradiation of the double solid solution (Ti 0.5 ,Zr 0.5) 2 (Al 0.5 ,Sn 0.5) C MAX phase

T2 - Defect evolution in the 350–800 °C temperature range

AU - Tunca, Bensu

AU - Greaves, G.

AU - Hinks, Jonathan A.

AU - Persson, Per O. A.

AU - Vleugels, Jozef

AU - Lambrinou, Konstantza

N1 - Score=10

PY - 2020/12/29

Y1 - 2020/12/29

N2 - Thin foils of the double solid solution (Zr 0.5 ,Ti 0.5 ) 2 (Al 0.5 ,Sn 0.5 )C MAX phase were in situ irradiated in a transmission electron microscope (TEM) up to a fluence of 1.3 ×10 17 ions cm -2 ( ∼7.5 dpa), using 6 keV He + ions. Irradiations were performed in the 350–800 °C temperature range. In situ and post-irradiation examination (PIE) by TEM was used to study the evolution of irradiation-induced defects as function of dose and temperature. Spherical He bubbles and string-like arrangements thereof, He platelets, and dis- location loops were observed. Dislocation loop segments were found to lie in non-basal-planes. At irradi- ation temperatures ≥450 °C, grain boundary tearing was observed locally due to He bubble segregation. However, the tears did not result in transgranular crack propagation. The intensity of specific spots in the selected area electron diffraction patterns weakened upon irradiation at 450 and 500 °C, indicating an increased crystal symmetry. Above 700 °C this was not observed, indicating damage recovery at the high end of the investigated temperature range. High-resolution scanning TEM imaging performed during the PIE of foils previously irradiated at 700 °C showed that the chemical ordering and nanolamination of the MAX phase were preserved after 7.5 dpa He + irradiation. The size distributions of the He platelets and spherical bubbles were evaluated as function of temperature and dose.

AB - Thin foils of the double solid solution (Zr 0.5 ,Ti 0.5 ) 2 (Al 0.5 ,Sn 0.5 )C MAX phase were in situ irradiated in a transmission electron microscope (TEM) up to a fluence of 1.3 ×10 17 ions cm -2 ( ∼7.5 dpa), using 6 keV He + ions. Irradiations were performed in the 350–800 °C temperature range. In situ and post-irradiation examination (PIE) by TEM was used to study the evolution of irradiation-induced defects as function of dose and temperature. Spherical He bubbles and string-like arrangements thereof, He platelets, and dis- location loops were observed. Dislocation loop segments were found to lie in non-basal-planes. At irradi- ation temperatures ≥450 °C, grain boundary tearing was observed locally due to He bubble segregation. However, the tears did not result in transgranular crack propagation. The intensity of specific spots in the selected area electron diffraction patterns weakened upon irradiation at 450 and 500 °C, indicating an increased crystal symmetry. Above 700 °C this was not observed, indicating damage recovery at the high end of the investigated temperature range. High-resolution scanning TEM imaging performed during the PIE of foils previously irradiated at 700 °C showed that the chemical ordering and nanolamination of the MAX phase were preserved after 7.5 dpa He + irradiation. The size distributions of the He platelets and spherical bubbles were evaluated as function of temperature and dose.

KW - MAX phase

KW - Solid solutions

KW - TEM

KW - Irradiation

UR - https://ecm.sckcen.be/OTCS/llisapi.dll/open/41849815

U2 - 10.1016/j.actamat.2020.116606

DO - 10.1016/j.actamat.2020.116606

M3 - Article

VL - 206

SP - 1

EP - 13

JO - Acta Materialia

JF - Acta Materialia

SN - 1359-6454

M1 - 116606

ER -

ID: 7001614