On the OSL curve shape and preheat treatment of electronic components from portable electronic devices

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The OSL decay curve of alumina-rich components from personal objects and the preheat treatment is investigated. An early observation showed that the dose increases with increasing OSL integration time. It is shown that this is caused by an unresolved low temperature TL peak (140°C) contributing to the OSL, but with a lower thermal stability than the main contributing TL peak at 190°C.


Original languageEnglish
Pages (from-to)746-748
JournalRadiation Measurements
Issue number3-6
Publication statusPublished - Mar 2010
Event7th International Conference on Luminescent Detectors and Transformers of Ionizing Radiation LUMDETR 2009 - Institute of Physics, Krakow, Krakow
Duration: 12 Jul 200912 Jul 2009


  • Accident dosimetry, Retrospective dosimetry, Portable electronic devices, Emergency dosimeter, Optically stimulated luminescence, Thermoluminescence

ID: 212610