On the OSL curve shape and preheat treatment of electronic components from portable electronic devices
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Abstract
The OSL decay curve of alumina-rich components from personal objects and the preheat treatment is investigated. An early observation showed that the dose increases with increasing OSL integration time. It is shown that this is caused by an unresolved low temperature TL peak (140°C) contributing to the OSL, but with a lower thermal stability than the main contributing TL peak at 190°C.
Details
| Original language | English |
|---|---|
| Pages (from-to) | 746-748 |
| Journal | Radiation Measurements |
| Volume | 45 |
| Issue number | 3-6 |
| DOIs | |
| Publication status | Published - Mar 2010 |
| Event | 7th International Conference on Luminescent Detectors and Transformers of Ionizing Radiation LUMDETR 2009 - Institute of Physics, Krakow, Krakow Duration: 12 Jul 2009 → 12 Jul 2009 |
Keywords
- Accident dosimetry, Retrospective dosimetry, Portable electronic devices, Emergency dosimeter, Optically stimulated luminescence, Thermoluminescence
ID: 212610