1. 1962
  2. The stacking fault energy in silicon

    Aerts, E., Delavignette, P., Siems, R. & Amelinckx, S., 1962, In : Journal of Applied Physics. 33, 10, p. 3078-3080 2 p.

    Research output: Contribution to journalArticle

  3. 1961
  4. "Stripper" measuring instrument for recording variations of threshold and channel width

    Binard, L. & Vanhorenbeeck, J., Nov 1961, Studiecentrum voor Kernenergie. 7 p. (SCK•CEN Reports; no. BLG-104)

    Research output: Report/bookBLG - Open report

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