Trends in the valence band electronic structures of mixed uranium oxides

Research output: Contribution to journalArticle

Authors

Institutes & Expert groups

  • FZJ - Forschungszentrum Jülich GmbH
  • UU - Uppsala University
  • HZDR - Helmholtz Zentrum Dresden Rossendorf - ESRF - The Rossendorf Beamline
  • HZDR - Helmholtz,Zentrum Dresden, Rossendorf
  • Aalto University

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DOI

Abstract

Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, -UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and the computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical aproximations.

Details

Original languageEnglish
Number of pages4
JournalChemical Communications
DOIs
Publication statusPublished - 8 Aug 2018

Keywords

  • Valence band electronic structure, Uranium oxides, RIXS, ESRF

ID: 4614810