Trends in the valence band electronic structures of mixed uranium oxides
Research output: Contribution to journal › Article › peer-review
Institutes & Expert groups
- FZJ - Forschungszentrum Jülich GmbH
- UU - Uppsala University
- HZDR - Helmholtz Zentrum Dresden Rossendorf - ESRF - The Rossendorf Beamline
- HZDR - Helmholtz,Zentrum Dresden, Rossendorf
- Aalto University
Documents & links
DOI
Abstract
Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, -UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and the computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical aproximations.
Details
| Original language | English |
|---|---|
| Number of pages | 4 |
| Journal | Chemical Communications |
| DOIs | |
| Publication status | Published - 8 Aug 2018 |
Keywords
- Valence band electronic structure, Uranium oxides, RIXS, ESRF
ID: 4614810