Abstract
Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, -UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and the computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical aproximations.
Details
Original language | English |
---|
Number of pages | 4 |
---|
Journal | Chemical Communications |
---|
DOIs | |
---|
Publication status | Published - 8 Aug 2018 |
---|